Determination of the electron density profile and its fluctuations by broad-band microwave reflectometry in the TJ-1 tokamak
- 14 September 1988
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 21 (9) , 1384-1390
- https://doi.org/10.1088/0022-3727/21/9/011
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Characterization of a Q-band microwave reflectometer for plasma diagnosis in the tokamak TJ-1International Journal of Infrared and Millimeter Waves, 1987
- Microwave reflectometry with the extraordinary mode on tokamaks: Determination of the electron density profile of Petula-BReview of Scientific Instruments, 1987
- A simple fixed-frequency reflectometer for plasma density profile measurements on JETJournal of Physics E: Scientific Instruments, 1987
- Experimental study of a swept reflectometer with a single antenna for plasma density profile measurementInternational Journal of Infrared and Millimeter Waves, 1985
- Measurement of electron density profile by microwave reflectometry on tokamaksReview of Scientific Instruments, 1985
- Theory of electron cyclotron absorption of magnetized plasmasPlasma Physics, 1982
- Experimental Study of Enhanced Diffusion by Electrostatic Fluctuations in an Ohmically Heated Toroidal PlasmaPhysical Review Letters, 1976