DLTS Measurement on Au-Doped Si p⁺n Junctions and Its Computer Simulation

• 1 December 1980
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 19  (12) , 2441-2449
• https://doi.org/10.1143/jjap.19.2441

Abstract

Keywords

• COMPUTER SIMULATION