Thickness dependence of breakdown field
- 1 November 1972
- journal article
- research article
- Published by Elsevier in Thin Solid Films
- Vol. 13 (2) , S23-S24
- https://doi.org/10.1016/0040-6090(72)90320-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Thickness dependence of breakdown field in thin filmsThin Solid Films, 1971
- Switching and breakdown in filmsThin Solid Films, 1971
- Electrical Breakdown in Thin Dielectric FilmsJournal of Vacuum Science and Technology, 1969
- Interferometric and x-ray diffraction study of “built-up” molecular films of some long chain compoundsSolid State Communications, 1966
- Thickness Influence in Breakdown Phenomena of Thin Dielectric FilmsPhysica Status Solidi (b), 1964