Ablative organic films for optical recording
- 1 July 1983
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 54 (7) , 3710-3711
- https://doi.org/10.1063/1.332586
Abstract
This work presents a new type of optical recording medium for a diode laser which is three times more sensitive than a chalcogenide thin film. This medium has a tetralayer structure of n–hexatriacontane, zinc stearate, Sb2S3 and Bi. The Bi layer absorbs a recording light beam and organic layers are ablated by heat evolved in the Bi layer. The high sensitivity characteristic of this medium is attributed to the use of low-melting-point material as the ablating layer and the effective use of the incident beam.This publication has 8 references indexed in Scilit:
- The structure of vacuum-deposited zinc stearate filmJournal of Colloid and Interface Science, 1983
- Infrared dyes for optical storageJournal of Vacuum Science and Technology, 1981
- Solvent-coated organic materials for high-density optical recordingJournal of Vacuum Science and Technology, 1981
- Ablative optical recording using organic dye-in-polymer filmsApplied Physics Letters, 1980
- Chalcogenide thin films for laser-beam recordings by thermal creation of holesJournal of Applied Physics, 1979
- Laser marking in dye–polymer systemsJournal of Applied Polymer Science, 1979
- High-performance Te trilayer for optical recordingApplied Physics Letters, 1979
- Antireflection structures for optical recordingIEEE Journal of Quantum Electronics, 1978