A unified model of carrier diffusion and sampling aperture effects on MTF in solid-state image sensors
- 1 January 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 39 (11) , 2621-2623
- https://doi.org/10.1109/16.163473
Abstract
No abstract availableKeywords
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