Determination of Energy Level of Atomic H in Crystalline Silicon by Use of Hydrogenation of Radiation Defects
- 1 January 1989
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 38-41, 1021-1026
- https://doi.org/10.4028/www.scientific.net/msf.38-41.1021
Abstract
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