Non-contact atomic force microscopy imaging of TiO2(100) surfaces
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 271-275
- https://doi.org/10.1016/s0169-4332(98)00539-x
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- Surface X-ray structure analysis of the TiO2(100)-(1 × 3) reconstructionSurface Science, 1998
- Atom-Resolved Image of theSurface by Noncontact Atomic Force MicroscopyPhysical Review Letters, 1997
- ESDIAD and LEED studies of the clean TiO2(100) surfaceSurface Science, 1996
- Evidence for the Tunneling Site on Transition-Metal Oxides: Ti(110)Physical Review Letters, 1996
- Extended defects on TiO2(100) 1 × 3Surface Science, 1994
- Interrelationship of structural elements on(100)-(1×3)Physical Review Letters, 1994
- Oxygen-vacancy sites on(100)1×3 using surface core-level-shift photoelectron diffractionPhysical Review B, 1993
- Structure of the TiO2(100) 1 × 3 surface determined by glancing angle X-ray diffraction and low energy electron diffractionSurface Science, 1992
- Step and point defect effects on TiO2(100) reactivitySurface Science, 1991
- The Surface Properties of Ionic MaterialsPublished by Springer Nature ,1983