Investigation of ultra-thin Ag films on Ni with the photoelectron emission microscope
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 17 (1) , 21-30
- https://doi.org/10.1016/0304-3991(85)90173-1
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Photo-electron emission microscopy of work function changesUltramicroscopy, 1983
- Depth of information in photoelectron microscopyUltramicroscopy, 1982
- Electron microscopy of surfacesUltramicroscopy, 1981
- Realisation of the gridless cylindrical mirror analyserJournal of Physics E: Scientific Instruments, 1979
- The work function of the elements and its periodicityJournal of Applied Physics, 1977
- Dipole moments associated with edge atoms; A comparative study on stepped Pt, Au and W surfacesSurface Science, 1977
- A model for the Auger electron spectroscopy of systems exhibiting layer growth, and its application to the deposition of silver on nickelSurface Science, 1973
- Experimental Investigation of Photoemission from Satellite Surface MaterialsJournal of Applied Physics, 1972
- Photoelectric work function measurements on nickel crystals and filmsSurface Science, 1971
- LEED study of the epitaxy of silver on nickel (111)Surface Science, 1970