A high-speed Si lateral photodetector fabricated over an etched interdigital mesa

Abstract
A new kind of high‐speed photodetector has been constructed utilizing the anisotropic etching technique. It is demonstrated that, functioning as an edge‐incident photodiode, the detector responds reliably to subnanosecond light pulses with 40% overall quantum efficiency. And, functioning as a phototransistor, it responds to cw radiation with a current gain. Compatibility with existing planar processing is another feature. Possible mechanisms involved are discussed.

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