Multiple scattering and the Compton profile of titanium

Monte Carlo methods recently introduced to correct for the effect of multiple scattering in Compton-profile measurements have been extended to take better account of the behavior of bound electrons. This procedure was applied to experimental Compton profiles of polycrystalline titanium measured with 60-keV $\gamma$ rays for two thicknesses. The resultant profiles show good agreement with a recent calculation based on a renormalized-free-atom model for a $3d^{2}4s^2$ electronic configuration.