Review: likelihood method for fitting Weibull log-linear models to accelerated life-test data

Publisher Website

1 January 1994

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability

Vol. 43 (3) , 361-365
https://doi.org/10.1109/24.326426

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

On the analysis of accelerated life-testing experiments
IEEE Transactions on Reliability, 1991
Accelerated Testing
Published by Wiley ,1990
A note on convergence problems in numerical techniques for accelerated life-testing analysis
IEEE Transactions on Reliability, 1988