A capacitance-based micropositioning system for x-ray rocking curve measurements
- 1 September 1979
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 50 (9) , 1062-1069
- https://doi.org/10.1063/1.1136010
Abstract
Certain types of x-ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long-term angular stability of approximately 10(-7) radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long-term overall angular stability.Keywords
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