BONDS IN AMORPHOUS Nb1-xSixSTUDIED BY X-RAY EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPY

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Abstract
X-ray emission bands (Si K, Si L, Nb Lβ2) and XPS spectra of amorphous a-Nb1-xSix (x=0.20, 0.80), cryst. silicon, a-Si and NbSi2 were combined to identify the origin of al1 their spectral features. The results show that the strength of Si3p-Nb4d mixing is stable and the p-d states account for the bond in the Nb-Si alloys. The Si-Nb bonds seem to be similar in Nb1-x Six and NbSi2 and invariable within a wide range of x

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