An in Situ Study of Mesostructured CTAB−Silica Film Formation during Dip Coating Using Time-Resolved SAXS and Interferometry Measurements
- 11 January 2002
- journal article
- research article
- Published by American Chemical Society (ACS) in Chemistry of Materials
- Vol. 14 (2) , 931-939
- https://doi.org/10.1021/cm011255u
Abstract
No abstract availableKeywords
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