Comparison of sensors and techniques for crop yield mapping
- 1 February 1996
- journal article
- Published by Elsevier in Computers and Electronics in Agriculture
- Vol. 14 (2-3) , 215-233
- https://doi.org/10.1016/0168-1699(95)00049-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Mapping of Spatially Variable Yield During Grain CombiningTransactions of the ASAE, 1989
- Quantitative Spatial Analysis of Soil in the FieldPublished by Springer Nature ,1985