Accurate cold-test model of helical TWT slow-wave circuits
- 1 April 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 45 (4) , 966-971
- https://doi.org/10.1109/16.662812
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Transmission line modelling of helix slow wave structuresPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Three-dimensional simulation of helix traveling-wave tube cold-test characteristics using MAFIAIEEE Transactions on Electron Devices, 1996
- Three-dimensional simulations of frequency-phase measurements of arbitrary coupled-cavity RF circuitsIEEE Transactions on Electron Devices, 1988
- Theoretical and experimental TWT helix loss determinationIEEE Transactions on Electron Devices, 1979
- Study of a plane short on a shielded helixIRE Transactions on Electron Devices, 1955
- Measurement of Circuit Impedance of Periodically Loaded Structures by Frequency PerturbationProceedings of the IRE, 1954