Enhancement of self-focusing threshold in sapphire with elliptical beams
- 15 July 1972
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 21 (2) , 58-60
- https://doi.org/10.1063/1.1654278
Abstract
The power threshold for optically induced bulk damage in sapphire is a sensitive function of the ellipticity of the incident beam shape. Experimental results are consistent with a simple self‐focusing theory.Keywords
This publication has 3 references indexed in Scilit:
- Observations of Moving Self-Foci in SapphirePhysical Review Letters, 1971
- Computer Studies in Self-FocusingPhysical Review B, 1969
- Large-Scale Self-Trapping of Optical Beams in the Paraxial Ray ApproximationPhysical Review B, 1968