Statistical fluctuations of the ionisation yield of low-energy electrons in He, Ne and Ar
- 14 April 1984
- journal article
- Published by IOP Publishing in Journal of Physics B: Atomic and Molecular Physics
- Vol. 17 (7) , 1391-1404
- https://doi.org/10.1088/0022-3700/17/7/022
Abstract
Using the Monte-Carlo method the statistical fluctuations of the ionisation yield produced during the degradation of low-energy electrons in the three noble gases He, Ne and Ar were studied. To do this, the probability P(T0, j) for exact j ionisations generated upon the complete slowing down of electrons of initial energy T0 was calculated in the energy range 20 eV0nu and central moments mnu up to the order nu =5 related to such well known quantities as the mean energy expended per ion pair formed, the Fano factor, and the generalised Fano factors introduced by Inokuti et al. (1980), all of which are able to characterise a special property of the ionisation number distribution, as for instance its variance, its asymmetry and its flatness near the centre.Keywords
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