Method of Measuring Spherical Aberration of an Electron Microscope Objective
- 1 June 1949
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 20 (6) , 631-632
- https://doi.org/10.1063/1.1698442
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Dark-Field Electron Microscopy. I. Studies of Crystalline Substances in Dark-FieldJournal of Applied Physics, 1948
- The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving PowerJournal of Applied Physics, 1947