On the measurement of integrated intensities

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Abstract
The measurement of integrated intensities directly by conventional diffraction arrangements is not possible because the specimen crystals are normally smaller than the incident beam cross section. If a micro-source and a bent-crystal monochromator are used, however, the crystal can be made to intercept the entire incident beam and it is possible to measure the integrated intensity for all reflections. It is also shown how the necessary geometrical conditions for several arrangements can be satisfied.

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