Observation of the melting-solidification processes of an Al crystal by synchrotron X-ray topography
- 30 September 1985
- journal article
- other
- Published by Elsevier in Journal of Crystal Growth
- Vol. 72 (3) , 748-752
- https://doi.org/10.1016/0022-0248(85)90233-7
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- In Situ Observation on Melt Growth Process of Tin Crystal by Means of Synchrotron X-Ray TopographyJapanese Journal of Applied Physics, 1984
- Ultra-high vacuum heating camera forin situsynchrotron radiation X-ray topographic studiesJournal of Applied Crystallography, 1982
- Observation by synchrotron X-ray topography of faceting evolution of grain boundaries during recrystallizationJournal of Crystal Growth, 1981
- Melting of silicon crystals and a possible origin of swirl defectsJournal of Crystal Growth, 1977
- Technique for the video display of X-ray topographic images and its application to the study of crystal growthJournal of Crystal Growth, 1974