A “Jc EXPECTATION RULE” FOR YBCO THIN FILMS PREPARED BY MOCVD AND LASER ABLATION

Abstract
An empirical “J c expectation rule” has been devised for YBCO thin films (1000–8000 Å) deposited on various substrates by MOCVD and laser ablation techniques. The “rule” is based on a normal state parameter M defined as the ratio of ΔR/ΔT and R/T, and directly predicts J c from resistivity measurements. The parameter also serves to delineate three general regions of J c behavior that are proposed to be linked to film characteristics.
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