X-ray and optical measurements in the In2O3-SnO2 system
- 16 March 1979
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 52 (1) , 231-238
- https://doi.org/10.1002/pssa.2210520125
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Occurrence of corundum-type indium(III) oxide under ambient conditionsInorganic Chemistry, 1977
- The solubilities of Sn in In2O3 and of In in SnO2 crystals grown from Sn—In meltsJournal of Crystal Growth, 1976
- Properties of Sn‐Doped In2 O 3 Films Prepared by RF SputteringJournal of the Electrochemical Society, 1975
- Chemical vapor deposition of transparent electrically conducting layers of indium oxide doped with tinThin Solid Films, 1975
- Optical and electrical properties of doped In2O3 filmsPhysica Status Solidi (a), 1975
- Optical properties of aggregated metal systems: Real metalsJournal of Applied Physics, 1973
- Highly Conductive, Transparent Films of Sputtered In[sub 2−x]Sn[sub x]O[sub 3−y]Journal of the Electrochemical Society, 1972
- Reflectance SpectroscopyPublished by Springer Nature ,1969