Secondary neutral mass spectrometry as a new tool fordepth resolved analysis of particulate matter
- 1 January 1991
- journal article
- Published by Elsevier in Journal of Aerosol Science
- Vol. 22, S835-S839
- https://doi.org/10.1016/s0021-8502(05)80229-0
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Mass spectrometry of secondary neutrals and ions for chemical analysis of saltsSurface and Interface Analysis, 1991
- Progress in solids analysis by sputtered neutral mass spectrometryVacuum, 1990