Abstract
The narrow defect Raman bands found in melt-quenched vitreous silica are also observed at the same frequencies and with the same bandwidths in heavily OH- and F-doped porous vitreous silica prepared by the sol-gel process. The chemical shifts in these bands as the internal surface area and the OH and F content are varied provide decisive evidence on the molecular structure of melt-quenched vitreous silica as described recently by two opposing models.

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