Calibration of an Optical Compensator by Ellipsometry
- 1 February 1966
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 5 (2) , 352
- https://doi.org/10.1364/ao.5.000352
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962
- The Calibration of Quarter-Wave Plates*Journal of the Optical Society of America, 1952