Spectroscopic Examination of Two Egyptian Masks: A Combined Method Approach

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Abstract
The identification of the materials used in painted works of art is of great importance for (art-) historians, conservators and keepers. Total-reflection X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MRS) have been shown to be successful in the identification of the pigments in artefacts, such as mediaeval manuscripts, polychrome sculptures as well as panel-, easel- and wall-painting. In this work, the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical Egyptian masks is presented. A gentle micro sampling method, which does not leave any visible trace on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.