Streak camera measurement of subnanosecond plastic scintillator properties
- 1 May 1978
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 49 (5) , 650-653
- https://doi.org/10.1063/1.1135476
Abstract
A streak camera technique with temporal resolution of 20 ps has been used to measure the fluorescence properties of several subnanosecond plastic scintillators. The method employs a vacuum light pipe coupled to an optical streak camera. The scintillators are excited by a 200-ps x-ray pulse generated by a 1.06-microm Nd:YAG laser focused onto an iron target. The time history of the low-energy x-ray pulse is measured with an x-ray streak camera. Results are given for NElll plastic scintillators doped with benzophenone or acetophenone, for PVT doped with butyl-PBD, and for a ZnO phosphor doped with Ga.Keywords
This publication has 4 references indexed in Scilit:
- Time-Resolved X-Ray Spectral Studies of Laser-Compressed TargetsPhysical Review Letters, 1976
- Sub-nanosecond plastic scintillatorsNuclear Instruments and Methods, 1976
- Picosecond x-ray streak cameraApplied Physics Letters, 1974
- Optical Constants of Vacuum-Evaporated Silver Films*Journal of the Optical Society of America, 1964