Estimating surface diffusion coefficients

• 20 March 2000
• journal article
• review article
• Published by Elsevier
• Vol. 49  (3) , 265-330
• https://doi.org/10.1016/0079-6816(95)00039-2

Abstract

Keywords

• SCANNING LOW-ENERGY ELECTRON DIFFRACTION
• LOW-ENERGY ELECTRON DIFFRACTION
• SCANNING TUNNELING MICROSCOPY
• SHM
• EC
• SCANNING TRANSMISSION ELECTRON MICROSCOPY
• FTIR
• LASER-INDUCED THERMAL DESORPTION
• TIP BLUNTING
• SECONDARY ELECTRON EMISSION
• SHG
• SHD
• FIM
• RBSIEM
• NUCLEAR MAGNETIC RESONANCE
• MD
• SCANNMG AUGER MICROSCOPY
• MB
• LOW-ENERGY ION SCATTERING
• FE