A comprehensive approach for modeling and testing analog and mixed-signal devices

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1990.114015

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Time-domain testing strategies and fault diagnosis for analog systems
IEEE Transactions on Instrumentation and Measurement, 1990
Ambiguity groups and testability
IEEE Transactions on Instrumentation and Measurement, 1989
Test-point selection and testability measures via QR factorization of linear models
IEEE Transactions on Instrumentation and Measurement, 1987