Characteristics of a set of 12.7-mm processor chips
- 1 October 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 22 (5) , 783-789
- https://doi.org/10.1109/jssc.1987.1052814
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-TestIBM Journal of Research and Development, 1983
- Design for Autonomous TestIEEE Transactions on Computers, 1981