An electron beam test system linked with a CAD database
- 31 December 1987
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 7 (2-4) , 267-274
- https://doi.org/10.1016/s0167-9317(87)80021-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
- A Fully-Automated Electron Beam Test System for VLSI CircuitsIEEE Design & Test of Computers, 1985