The influence of secondary fluorescence from elements adjacent to the microbeam spot on local concentration determination with PIXE
- 15 March 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 181 (1-3) , 135-139
- https://doi.org/10.1016/0029-554x(81)90595-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A digitally controlled scanning microprobe for protons and heavy ionsNuclear Instruments and Methods, 1978
- Enhancement in PIXE analysisNuclear Instruments and Methods, 1977
- Collimation of ion beams to micrometer dimensionsNuclear Instruments and Methods, 1975
- Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94Atomic Data and Nuclear Data Tables, 1973