Direct comparison of photoemission spectroscopy and in situ Kelvin probe work function measurements on indium tin oxide films
- 1 June 2006
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 152 (1-2) , 12-17
- https://doi.org/10.1016/j.elspec.2006.02.001
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Organic solar cells: An overviewJournal of Materials Research, 2004
- Recent progress of molecular organic electroluminescent materials and devicesMaterials Science and Engineering: R: Reports, 2002
- High-efficiency organic light-emitting diodesIEEE Journal of Selected Topics in Quantum Electronics, 2002
- A review of thin-film crystalline silicon for solar cell applications. Part 2: Foreign substratesSolar Energy Materials and Solar Cells, 2001
- Modification of the hole injection barrier in organic light-emitting devices studied by ultraviolet photoelectron spectroscopyApplied Physics Letters, 2000
- Dependence of indium–tin–oxide work function on surface cleaning method as studied by ultraviolet and x-ray photoemission spectroscopiesJournal of Applied Physics, 2000
- Photoemission study of the interface between phenyl diamine and treated indium–tin–oxideApplied Physics Letters, 1999
- Polymer band alignment at the interface with indium tin oxide: consequences for light emitting devicesChemical Physics Letters, 1999
- A photoelectron spectroscopy study on the indium tin oxide treatment by acids and basesApplied Physics Letters, 1999
- Work function of indium tin oxide transparent conductor measured by photoelectron spectroscopyApplied Physics Letters, 1996