PRODUCTION EXPERIENCE with BUILT-IN SELF-TEST in the IBM ES/9000 SYSTEM
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 28-36
- https://doi.org/10.1109/test.1991.519490
Abstract
This paper describes the performance of the Self-Test System used in the production of circuit modules for the new line of mainframes, the ES/9000 series. The system supports pseudorandom patterns generated and applied in a self-test mode from within the module, as well as control and pseudorandom stimuli and response compression through the IjO pins. Simulation-based diagnostics are used to generate repair actions to specific micro-nets, with an associated confidence level. Modules (containing roughly 500,000 gates) are being verified in under 3 minutes, with diagnosis of failing modules resulting in the isolation of a fault with 5 minutes of on-line time, followed by 11.7 minutes of off-line analysis.Keywords
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