Depth profiling of defects in a-Si:H by photothermal deflection spectroscopy
- 1 January 1991
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 137-138, 623-626
- https://doi.org/10.1016/s0022-3093(05)80195-4
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Photothermal detection of surface states in amorphous silicon filmsApplied Physics A, 1990
- Real time i n s i t u observation of the film growth of hydrogenated amorphous silicon by infrared reflection absorption spectroscopyApplied Physics Letters, 1990
- Surface states and in-depth inhomogeneity in a-Si:H thin films: Effects on the shape of the PDS sub-gap spectraJournal of Non-Crystalline Solids, 1989
- Photoacoustic Spectroscopy Theory for Multi-Layered Samples and Interference EffectJapanese Journal of Applied Physics, 1981