Space‐charge effects and ion distribution in plasma source mass spectrometry
- 1 June 1995
- journal article
- research article
- Published by Wiley in Journal of Mass Spectrometry
- Vol. 30 (6) , 841-848
- https://doi.org/10.1002/jms.1190300609
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Vapor generation of nonmetals coupled to microwave plasma-torch mass spectrometrySpectrochimica Acta Part B: Atomic Spectroscopy, 1995
- Elemental mass spectrometry using a helium microwave plasma torch as an ion sourceSpectrochimica Acta Part B: Atomic Spectroscopy, 1994
- Plasma source mass spectrometryInternational Journal of Mass Spectrometry and Ion Processes, 1992
- Space charge in ICP-MS: calculation and implicationsSpectrochimica Acta Part B: Atomic Spectroscopy, 1992
- Langmuir probe measurements of electron temperature and electron density behind the skimmer of an inductively coupled plasma mass spectrometerSpectrochimica Acta Part B: Atomic Spectroscopy, 1991
- Alteration of the ion-optic lens configuration to eliminate mass-dependent matrix-interference effects in inductively coupled plasma-mass spectrometrySpectrochimica Acta Part B: Atomic Spectroscopy, 1991
- Developments in plasma source/mass spectrometryAnalytica Chimica Acta, 1989
- Nonspectroscopic interelement interferences in inductively coupled plasma mass spectrometryAnalytical Chemistry, 1988
- Matrix-effect observations in inductively coupled plasma mass spectrometryJournal of Analytical Atomic Spectrometry, 1987
- Ion sampling for inductively coupled plasma mass spectrometryAnalytical Chemistry, 1985