A new technique for removing geometrical resolution effects in focal plane detectors
- 1 February 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 205 (3) , 387-389
- https://doi.org/10.1016/0167-5087(83)90002-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The mass of 18C from a heavy ion double-charge-exchange reactionNuclear Physics A, 1982
- High resolution detection of heavy ionsNuclear Instruments and Methods in Physics Research, 1982
- Improving the electric field uniformity in large hybrid focal plane detectorsNuclear Instruments and Methods, 1980
- Hybrid focal plane detectors for heavy ionsNuclear Instruments and Methods, 1979
- Spark counter focal plane detector systemNuclear Instruments and Methods, 1979
- A focal plane detector for both light and heavy ionsNuclear Instruments and Methods, 1978
- An ionization-chamber type of focal-plane detector for heavy ionsNuclear Instruments and Methods, 1976
- The Rochester heavy ion detectorNuclear Instruments and Methods, 1975