Non-Destructive centroid depth determination of analyte profiles using intensity attenuation in photon and electron spectroscopies
- 1 July 1988
- journal article
- abstracts
- Published by Wiley in Surface and Interface Analysis
- Vol. 12 (2) , 167-169
- https://doi.org/10.1002/sia.740120222
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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