The depth distribution function in Auger/XPS analysis
- 1 July 1992
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (7) , 555-560
- https://doi.org/10.1002/sia.740180717
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Analytical expression describing the attenuation of Auger electrons and photoelectrons in solidsSurface and Interface Analysis, 1991
- Background intensity determination in AES/XPSSurface Science, 1988
- A comparison of electron transport in AES/PES with neutron transport theorySurface Science, 1985
- The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solidsSurface Science, 1984
- The effect of elastic scattering on the effective inelastic mean free pathVacuum, 1983
- Electron inelastic mean free paths and energy losses in solids: I. Aluminum metalSurface Science, 1979
- Elementary solutions of the transport equation and their applicationsAnnals of Physics, 1960
- Transfer Problems and the Reciprocity PrincipleReviews of Modern Physics, 1957