Measurement of the piezoelectricity of films with scanning tunneling microscopy

• 1 May 1995
• journal article
• Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
• Vol. 13  (3) , 1316-1319
• https://doi.org/10.1116/1.587845

Abstract

Keywords

• PIEZOELECTRICITY
• MEASUREMENT
• SCANNING TUNNELING MICROSCOPY
• FILMS WITH SCANNING