THE NATURE OF INTERMEDIATE RANGE ORDER IN Si:F:H:(P) ALLOY SYSTEMS

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Abstract
Our investigation of intrinsic-Si:F:H alloys have shown them to be totally amorphous with no detectable intermediate range order or microcrystalline phase using TEM, and Raman techniques. We report our investigation of highly P-doped Si:F:H alloys having an intermediate range order. The characteristic length of this order is 20 to 60Å. Transmission electron microscopy is used to corroborate the particle size, and the volume fraction of crystallinity in a two-phase system, determined by Raman scattering. Transmission electron diffraction indicates that the structure is similar to micro-crystals. Unlike conductivity, electroreflectance response does not depend on the critical volume fraction of crystallinity in a percolation process. The high conductivity and low optical absorption for these P-doped Si:F:H alloys are ideal properties for contact layers in an a-Si : F : H solar cell

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