Measurement of Dislocation Densities by the Lambot Method
- 1 March 1959
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 30 (3) , 418-426
- https://doi.org/10.1063/1.1735179
Abstract
The applicability of the Lambot x‐ray technique to dislocation density measurements is considered using several sample models of the dislocation array. The expression relating dislocation density of a random array to the angular misorientation of a particular set of lattice planes is derived. The dependence of broadening on the size of the diffracting area is found to satisfy this expression in the case of plastically deformed KCl. Limitations on the use of the method are discussed.This publication has 7 references indexed in Scilit:
- A study of 〈112〉 edge dislocations in bent silicon-iron single crystalsActa Metallurgica, 1956
- Crystal perfection in aluminum single crystalsActa Metallurgica, 1955
- Dislocations in low-angle boundaries in germaniumActa Metallurgica, 1955
- Sur la mesure des désorientations réticulaires dans les monocristaux métalliquesActa Metallurgica, 1953
- Some geometrical relations in dislocated crystalsActa Metallurgica, 1953
- XCII. The reflexion of X-rays from imperfect crystalsJournal of Computers in Education, 1922
- XXXIV. The theory of X-ray reflexionJournal of Computers in Education, 1914