A Practical Method for the Determination of the Instrumental Full Width at Half Maximum
- 1 June 1988
- journal article
- research article
- Published by Cambridge University Press (CUP) in Powder Diffraction
- Vol. 3 (2) , 84-85
- https://doi.org/10.1017/s0885715600013282
Abstract
X-ray diffraction and neutron spectra present a peak assembly whose maxima are centered at angles corresponding to Bragg's law.Analysis of diffracted intensity profiles in each peak can be used to estimate such morphologic characteristics of the samples as preferred orientation (Brindley and Kurtosy, 1961; Martin, 1966); crystallite sizes (Scherrer, 1919; Warren and Averbach, 1950; Wilson, 1962; and Guérin et al., 1986); and crystal shapes (Wilson, 1949). Such analysis can also be used to estimate the determination of residual stress and lattice defects (Warren and Averbach, 1950; Wilson, 1963). In such studies, a detailed analysis of the diffraction distribution is required and consequently adjustment of intensity values must be carried out, as they are affected by systematic errors in the measuring apparatus (for detailed description, see Klug and Alexander, 1974 and Wilson 1967).Keywords
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