Substrate Current due to Impact Ionization in MOS-FET

• 1 June 1976
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 15  (6) , 1127-1133
• https://doi.org/10.1143/jjap.15.1127

Abstract

Keywords

• IMPACT IONIZATION
• MOS FET
• SUBSTRATE CURRENT
• CURRENT DUE
• DUE TO IMPACT
• IONIZATION IN MOS