Wide-band de-embedding with a short, an open, and a through line

1 January 1986

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 74 (1) , 71-74
https://doi.org/10.1109/PROC.1986.13404

Abstract

A wide-band procedure for subtracting the effects of fixtures and device packages or carriers from measured scattering parameters with only a short, an open, and a through line as standards is presented.

Keywords

WIDEBAND
SCATTERING PARAMETERS
TRANSMISSION LINE MATRIX METHODS
FIXTURES
EQUATIONS
PACKAGING
IMPEDANCE
CIRCUITS
TESTING
MEASUREMENT STANDARDS