Use of the electron microscope to measure the remanent magnetization of high coercivity thin films
- 1 November 1971
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 4 (11) , 833-836
- https://doi.org/10.1088/0022-3735/4/11/009
Abstract
Describes how the electron microscope, operating as a low angle diffraction camera, has been used to measure the remanent magnetization of hard magnetic films up to 6.4*104 A m-1 (800 Oe) coercivity. Experimental details are described and a full discussion of errors is given. Besides having good accuracy, the method can be used for the measurement of anhysteretic magnetization parameters.Keywords
This publication has 3 references indexed in Scilit:
- Some techniques of transmission Lorentz microscopyJournal of Physics E: Scientific Instruments, 1969
- Combined electron microscopy and energy analysis of an internally oxidized Ni + Si alloyPhilosophical Magazine, 1966
- Low‐angle electron diffractionJournal of the Royal Microscopical Society, 1966