Fault diagnosis of logical circuits
- 1 October 1969
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Some new techniques for finding minimal set of tests which detect faults in combinational logic networks are described. A systematic procedure which can be programmed on a digital computer is given. Moreover, a new approach to the design of fault detection experiments for sequential machines which takes into account the actual construction of the sequential network is described.Keywords
This publication has 5 references indexed in Scilit:
- Variable-Length Distinguishing Sequences and Their Application to the Design of Fault-Detection ExperimentsIEEE Transactions on Computers, 1968
- Fault Testing and Diagnosis in Combinational Digital CircuitsIEEE Transactions on Computers, 1968
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966
- Fault detecting experiments for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1964