Surface and bulk electronic structure of thin-film wurtzite GaN
- 15 October 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 56 (16) , 10271-10275
- https://doi.org/10.1103/physrevb.56.10271
Abstract
The bulk and surface valence-band electronic structure of thin-wurtzite GaN has been studied using angle-resolved photoemission spectroscopy. The bulk band dispersion along the , and directions of the bulk Brillouin zone was measured. Our results indicate the local-density approximation band-structure calculations using partial-core corrections for the Ga states predict the relative dispersion of many of the observed bands with a high degree of accuracy. Furthermore, a nondispersive feature was identified near the valence-band maximum in a region of space devoid of bulk states. This feature is identified as emission from a surface state on GaN(0001)-(1×1). The symmetry of this surface state is even with respect to the mirror planes of the surface and polarization measurements indicate that it is of character, consistent with a dangling-bond state.
Keywords
This publication has 11 references indexed in Scilit:
- Study of oxygen chemisorption on the GaN(0001)-(1×1) surfaceJournal of Applied Physics, 1996
- Electronic structure of cubic gallium nitride films grown on GaAsJournal of Vacuum Science & Technology A, 1996
- Growth of thin Ni films on GaN(0001)-(1×1)Physical Review B, 1993
- Metal contacts to gallium nitrideApplied Physics Letters, 1993
- GaN, AlN, and InN: A reviewJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992
- First-principles total-energy calculation of gallium nitridePhysical Review B, 1992
- The electronic structure of solids studied using angle resolved photoemission spectroscopyProgress in Solid State Chemistry, 1991
- Epitaxial growth of zinc blende and wurtzitic gallium nitride thin films on (001) siliconApplied Physics Letters, 1991
- Design of a high-resolution angle-resolving electron energy analyzerReview of Scientific Instruments, 1983
- Angle-resolved photoemission, valence-band dispersions, and electron and hole lifetimes for GaAsPhysical Review B, 1980