Transient Response Characteristics of Capacitive Potential Devices

1 September 1971

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Apparatus and Systems

Vol. PAS-90 (5) , 1989-2001
https://doi.org/10.1109/TPAS.1971.292994

Abstract

Full voltage line to ground fault tests are performed on typical potential devices and the subsidence transient recorded. To show the worst case of residual voltage, faults are initiated while the primary voltage is passing through crest and zero.

Keywords

TRANSIENT RESPONSE
CIRCUIT TESTING
VOLTAGE
EQUIVALENT CIRCUITS
CIRCUIT FAULTS
PROTECTIVE RELAYING
SWITCHES
POWER SYSTEM TRANSIENTS
CIRCUIT ANALYSIS COMPUTING
OSCILLOSCOPES

This publication has 1 reference indexed in Scilit:

A New Metering Accuracy Capacitive Potential Device
IEEE Transactions on Power Apparatus and Systems, 1966